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Editor Name: Bruce C. Kim
University: City University of New York
Biography: Dr. Bruce Kim received his Ph.D. from Georgia Tech. He has been working as a faculty since 1996. His current research interests include fabrication of nanosensors for chemical and biomedical applications, 3D TSV design-for-testability and packaging, and radio frequency and high-voltage IC testing and characterizations. Dr. Kim is a 1997 recipient of the prestigious National Science Foundation CAREER Award. He received three Meritorious Service Awards from the IEEE Computer Society. He has served as associate editors of the IEEE Design and Test of Computers, the IMAPS Microelectronics Journal, the IEEE Transactions of Components and Packaging Technology, and Journal of Electronic Testing Theory and Applications (JETTA). He has been serving as a BoG member of the IEEE CPMT Society for over ten years. Dr. Kim is a fellow of IMAPS and Faculty Senator of CCNY.