This work presents a study on structural and electrical properties of electron-beam evaporated CdTe thin films with the application of post-CdCl₂ treatment. The films having thickness 550 nm were grown on glass and ITO substrates followed by CdCl₂ treatment and annealing at different temperature and then subjected to X-ray diffractometer and source-meter to investigate the structural and electrical properties, respectively. The films are found to be polycrystalline in nature having cubic phase at low annealing temperature (≤ 320 °C) and mixture of cubic and hexagonal phases at higher temperature (470 °C). The improvement in crystallinity is also observed with CdCl₂ heat-treatment and maximum grain-growth achieved for films annealed at 320 °C. The electrical analysis reveals that the current have linear behavior with voltage and electrical resistivity is increased with post-CdCl₂ treatment. The investigated results indicate that the post-CdCl₂ treated films annealed at 320 °C may be well-suitable for thin film solar cells as an absorber layer.